Wafer Mfg.

  1. CAI519 Canon FPA 3000 i5+

    Other Wafer Production Equipment

    CAI519 Canon FPA 3000 i5+

    Canon FPA 3000 i5+

    General Configuration:

    • FPA 3000 - i5(+)
    • Manufactured in  June / 1997
      • 8“ Wafer Chuck, Notch PA unit
      • 6“ Nikon-type Reticle Changer
      • Reticle Barcode-Reader =   yes
      • Cassette Barcode Reader = yes
      • Pellicle Particle Checker =   yes
      • Online - ESPA =   yes
      • Interface type:   right
      • Standard flys eye lens
      • Chamber type: CD80
  2. Surface Planer DPLAN1

    Flat Grinders

    Surface Planer DPLAN1

    The "DPLAN1" (DFS8960 Surface Planer from Disco) is a high-precision tool used in the manufacturing industry for surface finishing. The system is currently fully functional and was used regularly in production until February 2025.In addition to the mainframe itself, the equipment includes a sedimentation tank (collection container), a DTU1531 (chiller unit), and two duct units for exhausting the process chambers!The tool has been operated in both 8" and 12" configurations and is in perfect condition.
  3. DISCO 28 DTG8440

    Flat Grinders

    DISCO 28 DTG8440

    DISCO 28 DTG8440 Grinding Tool --> 8 Inch Taiko

  5. Trikon Sigma FxP200 RevA mit MX800 Platform

    Other Wafer Production Equipment

    Trikon Sigma FxP200 RevA mit MX800 Platform

    It´s a Trikon Sigma FxP200 with 4 Std RevA DEP Chambers, 1 RevA HSE (not complete),

    1 MKII Heat Chamber. Brooks MX800 Platform with 2 Swing Out VCE6 Loadlocks. The

    Platform is upgradet from T5 Controller (MX800) to GTM with PC104 Controller.  All DEP Chambers HSE and Transport has CTI Onboard 8F Cryos and 2 9600 Cryo Compressor. No Forline Pumps

    Make: Trikon Tech Ltd.

    Model: Sigma FxP200 RevA

    1 unit @ Best Price

    Villach, Austria

    Item 260582

  12. AFM-2 (METV44-1)

    Other Wafer Manufacturing Metrology Equipment

    AFM-2 (METV44-1)

    Atomic Force Microscope (AFM)An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.